Failure Analysis Laboratory
Altest Corporations Failure Lab Analysis delivers a comprehensive test report for Individual Components from non-destructive testing to destructive testing which allows isolation of the PCB/PCBA failure, including a root cause failure analysis to identify the conditions and specific phenomena behind the failure.
Visual Inspection
Altest Lab Visual Inspection includes (not limited) to the below items:
- Correct Device Marking
- Country of Origin
- Date Code
- Black Topping
- Contamination
- Lead and Surface Defects
- Oxidation
- Logo Marking
- Data Sheet Matching
Digital Microscope
Altest has purchased two of these superior microscopes with the ability to view, capture, and measure.
- This is the #1 digital microscope in the world used by all major manufacturers.
- Offers instant measurement and simultaneous measurement of all surfaces using 3D.
X-RAY
DAGE X-RAY system with 3D reconstruction
- Very High Power CT (Computed Tomography X-Ray to see under BGA’s)
- The system has geometric magnification and total 60,000x with digital zoom. There is nothing that you cannot see in the process of X-Ray detection.
- Altest X-Ray System is used to inspect circuit boards and Semiconductor devices too detect errors/anomolies in the PCB assembly.
SAM
- Scanning acoustic microscopy (SAM) or Acoustic Micro Imaging (AMI) is a powerful, non-destructive technique that can detect hidden defects in elastic and biological samples as well as non-transparent hard materials.
- By monitoring the internal features of a sample in three-dimensional integration, this technique can efficiently find physical defects such as cracks, voids, and delamination with high sensitivity
Decapsulation
- Failure Analysis Decapsulation refers to the process of removing the encapsulation material or package from a semiconductor device to expose the underlying components for further analysis.
Curve Trace
- A curve tracer is a specialised piece of electronic test equipment used to analyze the characteristics of discrete electronic components.
- The curve tracer contains voltage and current sources that can be used to stimulate the device under test (DUT).
Our engineers will communicate directly and comprehensively with your team.
In addition, to our equipment and techniques, we have an expert FA team who will work to identify your PCBA defects and root cause analysis. Our engineers will communicate directly and comprehensively with your team. We have extensive experience with all major electronic components, bare printed circuit fabrication, as well as printed circuit assembly processing. You will receive a detailed test report tailored to your requirements.